发明名称 Semiconductor device and fabrication method thereof
摘要 For forming a gate electrode, a conductive film with low resistance including Al or a material containing Al as its main component and a conductive film with low contact resistance for preventing diffusion of Al into a semiconductor layer are laminated, and the gate electrode is fabricated by using an apparatus which is capable of performing etching treatment at high speed.
申请公布号 US8440484(B2) 申请公布日期 2013.05.14
申请号 US201213531149 申请日期 2012.06.22
申请人 YAMAZAKI SHUNPEI;SUZAWA HIDEOMI;ONO KOJI;KUSUYAMA YOSHIHIRO;SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;SUZAWA HIDEOMI;ONO KOJI;KUSUYAMA YOSHIHIRO
分类号 H01L21/00;H01L29/43;H01L21/20;H01L21/265;H01L21/336;H01L21/77;H01L21/8234;H01L21/84;H01L27/088;H01L27/12;H01L29/423;H01L29/49;H01L29/786 主分类号 H01L21/00
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