Semiconductor memory devices including burn-in test circuits

摘要

A semiconductor memory device includes a memory cell array including a first memory cell coupled to a first bit line and a word line, and a second memory cell coupled to a second bit line and the word line and disposed adjacent to the first memory cell. A controller circuit is configured to provide first and second precharge voltages to the first and second bitlines, respectively. The first precharge voltage is provided as a positive power supply voltage and the second precharge voltage is provided as a negative stress voltage during a burn-in test operation. Related methods of operation are also discussed.