发明名称 Electromigration-resistant and compliant wire interconnects, nano-sized solder compositions, systems made thereof, and methods of assembling soldered packages
摘要 A nano-sized metal particle composite includes a first metal that has a particle size of about 50 nanometer or smaller. A wire interconnect is in contact with a reflowed nanosolder and has the same metal or alloy composition as the reflowed nanosolder. A microelectronic package is also disclosed that uses the reflowed nanosolder composition. A method of assembling a microelectronic package includes preparing a wire interconnect template. A computing system includes a nanosolder composition coupled to a wire interconnect.
申请公布号 US8441118(B2) 申请公布日期 2013.05.14
申请号 US20090589409 申请日期 2009.10.22
申请人 HUA FAY;INTEL CORPORATION 发明人 HUA FAY
分类号 H01L23/04 主分类号 H01L23/04
代理机构 代理人
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