发明名称 |
METHOD OF CALIBRATING MARKING FOR LASER MARKING SYSTEM |
摘要 |
PURPOSE: A marking calibrating method for a laser marking system is provided to have a desire marking shape without contortion by the mechanic characteristics of a laser scanner using a mapping function which converts a second marking pattern into a first marking pattern. CONSTITUTION: A marking calibrating method for a laser marking system comprises the following steps. A laser scanner(120) receives first image data including a first marking pattern(300), and marks the first marking pattern to a workpiece(W). A vision camera(130) records a second marking pattern(400) which is actually marked on the workpiece where the first marking pattern is put, and produces second image data including the second marking pattern. A control unit(140) compares the first marking pattern of the first image data and the second marking pattern of the second image data, and calculates a mapping function which converts the second marking pattern into the first marking pattern. The control unit calibrates the marking of the laser marking system using the mapping function. [Reference numerals] (100) Laser marking system; (110) Laser generator; (120) Laser scanner; (130) Vision camera; (140) Control unit; (400) Second marking pattern; (AA) Mark a first marking pattern; (BB) Photograph a second marking pattern; (W) Object to be processed |
申请公布号 |
KR20130049375(A) |
申请公布日期 |
2013.05.14 |
申请号 |
KR20110114367 |
申请日期 |
2011.11.04 |
申请人 |
K-LAB CO., LTD. |
发明人 |
KWON, GOO CHEOL;LIM, HAK GYU |
分类号 |
B23K26/18;B23K26/346;B41M5/24 |
主分类号 |
B23K26/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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