发明名称 METHOD OF CALIBRATING MARKING FOR LASER MARKING SYSTEM
摘要 PURPOSE: A marking calibrating method for a laser marking system is provided to have a desire marking shape without contortion by the mechanic characteristics of a laser scanner using a mapping function which converts a second marking pattern into a first marking pattern. CONSTITUTION: A marking calibrating method for a laser marking system comprises the following steps. A laser scanner(120) receives first image data including a first marking pattern(300), and marks the first marking pattern to a workpiece(W). A vision camera(130) records a second marking pattern(400) which is actually marked on the workpiece where the first marking pattern is put, and produces second image data including the second marking pattern. A control unit(140) compares the first marking pattern of the first image data and the second marking pattern of the second image data, and calculates a mapping function which converts the second marking pattern into the first marking pattern. The control unit calibrates the marking of the laser marking system using the mapping function. [Reference numerals] (100) Laser marking system; (110) Laser generator; (120) Laser scanner; (130) Vision camera; (140) Control unit; (400) Second marking pattern; (AA) Mark a first marking pattern; (BB) Photograph a second marking pattern; (W) Object to be processed
申请公布号 KR20130049375(A) 申请公布日期 2013.05.14
申请号 KR20110114367 申请日期 2011.11.04
申请人 K-LAB CO., LTD. 发明人 KWON, GOO CHEOL;LIM, HAK GYU
分类号 B23K26/18;B23K26/346;B41M5/24 主分类号 B23K26/18
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