发明名称 CALIBRATION SAMPLE FOR FLUORESCENT X-RAY ANALYSIS, FLUORESCENT X-RAY ANALYZER WITH THE SAME AND FLUORESCENT X-RAY ANALYSIS METHOD USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a calibration sample or the like for fluorescent X-ray analysis of a liquid sample, which can be used for a long time and in which accurate drift calibration can be performed. <P>SOLUTION: A calibration sample 20 is a solid-state calibration sample for calibrating aging in measured X-ray intensity of an analysis target metal element in fluorescent X-ray analysis of a liquid sample S. In the calibration sample 20, a metal layer 21 containing the analysis target metal element is formed while overlapping a light element layer 22 in which at least one light element of hydrogen, boron, carbon, nitrogen, oxygen and fluorine has a maximum mol fraction and of which the thickness is 1 mm or more. In the metal layer 21, a surface at the side opposite to a surface confronted with the light element layer 22 is used as an analysis surface 23. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013088216(A) 申请公布日期 2013.05.13
申请号 JP20110227624 申请日期 2011.10.17
申请人 RIGAKU CORP 发明人 KOBAYASHI HIROSHI
分类号 G01N23/223 主分类号 G01N23/223
代理机构 代理人
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