发明名称 X-RAY FOREIGN MATTER DETECTOR
摘要 <P>PROBLEM TO BE SOLVED: To provide an X-ray foreign matter detector capable of preventing deterioration in foreign matter detection performance by matching the size and shape of an object to be inspected on two X-ray images obtained by an energy subtraction method. <P>SOLUTION: An X-ray foreign matter detector comprises: a support construction 100 for supporting an X-ray tube 31 in a manner where a position thereof relative to an X-ray line sensor 51 is adjustable; an adjustment determination unit 81 for obtaining a first waveform and a second waveform that indicate shading changes in a detection width direction of an object W to be inspected from a first X-ray image data and a second X-ray image data, and for determining that an adjustment direction of the X-ray tube 31 is a direction from the other end point of a trapezoidal shape formed by the first waveform to one end point thereof in a direction (Y-axis) orthogonal to a conveyance direction of the object W to be inspected on a plane surface parallel to a conveyance surface, when an angle (angle &theta;1) of the one end point of a lower base of the trapezoidal shape formed by the first waveform is smaller than an angle (angle &theta;2) of an end point in the same direction of a trapezoidal shape formed by the second waveform; and a display device 5 for displaying an adjustment direction determined by the adjustment determination unit 81. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013088144(A) 申请公布日期 2013.05.13
申请号 JP20110226065 申请日期 2011.10.13
申请人 ANRITSU SANKI SYSTEM CO LTD 发明人 KANAI TAKASHI;MIYAZAKI ITARU
分类号 G01N23/04 主分类号 G01N23/04
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