发明名称 COMPONENT CONCENTRATION MEASURING APPARATUS AND COMPONENT CONCENTRATION MEASURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To propose a novel approach for acquiring a temporally decomposed waveform of scattering light with a high resolution, and to propose an approach for measuring the concentration of a component contained in an examinee with high accuracy. <P>SOLUTION: Light-source beams from a light source 301 are split by a splitter 302, and an examinee is irradiated with one of the light beams as measuring light by an irradiator 303. Light emitted from the examinee is converged by a convergence section 304 and relayed to an optical converter 307 by a relay 305. On the other hand, the other beam split by the splitter 302 is guided to an optically driven shutter 311 as gate light. In this event, an optical path length of the gate light is changed by a gate light guide 309 and gate light of a different optical path length is guided to a Kerr substance 311A. Then, a temporally decomposed waveform is determined from the result of detecting the intensity of light in the changed optical path length, and the concentration of a component contained in the examinee is calculated. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013088244(A) 申请公布日期 2013.05.13
申请号 JP20110227932 申请日期 2011.10.17
申请人 SEIKO EPSON CORP;HOKKAIDO UNIV 发明人 NISHIDA KAZUHIRO;SHIMIZU KOICHI
分类号 G01N21/27;A61B5/1455 主分类号 G01N21/27
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