发明名称 EDDY CURRENT FLAW INSPECTION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide an eddy current flaw inspection device for appropriately detecting a position or length of a flaw in a circumferential direction of a conductor. <P>SOLUTION: The eddy current flaw inspection device is provided with: a pair of detection coils (L1A and L2A to L1D and L2D) placed along a carrier path (250) of a conductor (200) to be inspected coaxially and away from it; and a detection part in which two lines of a bridge comprise respective detection coils of the pair of detection coils (L1A and L2A to L1D and L2D) and which includes an AC bridge circuit for outputting a detection signal showing whether or not balance of the bridge is lost. The pair of detection coils (L1A and L2A to L1D and L2D) have electromagnetic shielding bodies (51 to 54) placed at a part in the circumferential direction on a surface facing the carrier path (250) side of the pair of detection coils. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013088345(A) 申请公布日期 2013.05.13
申请号 JP20110230681 申请日期 2011.10.20
申请人 MITSUBISHI MATERIALS CORP;NIPPON ESUTEKKU:KK 发明人 UENO AKIO
分类号 G01N27/90 主分类号 G01N27/90
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