METHOD AND APPARATUS FOR IDENTIFYING AND CORRECTING SPHERICAL ABERRATION IN MICROSCOPE IMAGING BEAM PATH

摘要

PROBLEM TO BE SOLVED: To provide a method and apparatus for identifying and correcting spherical aberrations in a microscope imaging beam path.

SOLUTION: There is provided a method for identifying a spherical error of a microscope imaging beam path (7) in a context of microscopic imaging of a sample (9) using a microscope (1) having an objective (10) and a coverslip (2) which carries or covers the sample (9) placed in the imaging beam path. A measurement beam (130) is guided in decentered fashion, outside an optical axis (8) of the objective (10), through the objective (10) onto the sample (9). A measurement beam (132) reflected at an interface (116) between the sample (9) and the coverslip is guided through the objective (10) onto a detector (128). The detector (128) acquires an intensity profile of the reflected measurement beam (132), and the presence of a spherical error is determined qualitatively and/or quantitatively from the intensity profile.

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