PARALLEL OPTICAL EXAMINATIONS OF A SAMPLE

摘要

The invention relates to a cartridge(400), a sensor device, and a method for the optical examination of a sample. A first output light beam that originates from a total internal reflection at a detection surface of a TIR chamber and a second output light beam(L2') that comes from the interior of an inspectable chamber(420) are both received within an observation region(OR). Preferably, these output light beams are detected with the same light detector, e.g. an image sensor. The invention hence allows for observing a total internal reflection at the TIR chamber and for looking into the inspectable chamber(420) from the same observation region(OR). This is for example enabled by different inclinations of the windows encountered by the first and the second output light beams, by different optical elements(407) in the paths of the output light beams, and/or by light scattering surface structures in the inspectable chamber.