发明名称 SUBSTRATE INSPECTION DEVICE AND SUBSTRATE CARRYING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a substrate inspection device and a substrate carrying method capable of inspecting a substrate in a short tact time. <P>SOLUTION: A substrate inspection device 1 according to the present invention comprises: a substrate carrying-in part 3 for carrying a substrate to be inspected therein; a substrate inspection part 4 for inspecting the substrate; a substrate carrying-out part 5 for carrying out the substrate that has been inspected; a floating plate 20 for floating the substrate by emitting gas; substrate carrying parts 6, 7 for holding the substrate carried in the substrate carrying-in part 3 and floated by the floating plate 20, and independently moving and carrying it on an independent carrying shaft; and a control part 10 for the substrate carrying parts 6, 7 holding the substrates so that they are not overlaid on each block divided into the substrate carrying-in part 3, the substrate inspection part 4, and the substrate carrying-out part 5. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013084798(A) 申请公布日期 2013.05.09
申请号 JP20110224018 申请日期 2011.10.11
申请人 OLYMPUS CORP 发明人 KIUCHI TOMOKAZU
分类号 H01L21/677;B65G49/06;G01N21/84;G01N21/958 主分类号 H01L21/677
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