发明名称 OFFSET COMPENSATION FOR SENSE AMPLIFIERS
摘要 A method of re-offsetting a plurality of amplifier is provided. The method includes testing the plurality of amplifiers based on a re-offset value at bulks of compensation transistors of the plurality of amplifiers; identifying a first group of first amplifiers of the plurality of amplifiers favoring reading a first logic level and/or a second group of second amplifiers of the plurality of amplifiers favoring reading a second logic level different from the first logic level, based on results of the testing step; changing the re-offset value to a new re-offset value; re-offsetting the first group of first amplifiers and/or the second group of second amplifiers based on the new re-offset value; and re-testing the first group of first amplifiers and the second group of second amplifiers.
申请公布号 US2013113552(A1) 申请公布日期 2013.05.09
申请号 US201213728637 申请日期 2012.12.27
申请人 MANUFACTURING COMPANY, LTD. TAIWAN SEMICONDUCTOR;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 UPPUTURI BHARATH;SAMPIGETHAYA SHREEKANTH
分类号 G01R27/02 主分类号 G01R27/02
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