发明名称 |
OFFSET COMPENSATION FOR SENSE AMPLIFIERS |
摘要 |
A method of re-offsetting a plurality of amplifier is provided. The method includes testing the plurality of amplifiers based on a re-offset value at bulks of compensation transistors of the plurality of amplifiers; identifying a first group of first amplifiers of the plurality of amplifiers favoring reading a first logic level and/or a second group of second amplifiers of the plurality of amplifiers favoring reading a second logic level different from the first logic level, based on results of the testing step; changing the re-offset value to a new re-offset value; re-offsetting the first group of first amplifiers and/or the second group of second amplifiers based on the new re-offset value; and re-testing the first group of first amplifiers and the second group of second amplifiers.
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申请公布号 |
US2013113552(A1) |
申请公布日期 |
2013.05.09 |
申请号 |
US201213728637 |
申请日期 |
2012.12.27 |
申请人 |
MANUFACTURING COMPANY, LTD. TAIWAN SEMICONDUCTOR;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
UPPUTURI BHARATH;SAMPIGETHAYA SHREEKANTH |
分类号 |
G01R27/02 |
主分类号 |
G01R27/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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