发明名称 METAL-INSULATOR-METAL CAPACITOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
摘要 A metal-insulator-metal (MIM) capacitor structure includes a first dielectric layer, a first damascene electrode layer, an insulating barrier layer, a second dielectric layer and a second damascene electrode layer. The first damascene electrode layer is formed in the first dielectric layer. The insulating barrier layer covers the first dielectric layer and the first damascene electrode layer, and is a single layer structure. The second dielectric layer is formed on the insulating barrier layer. The second damascene electrode layer is formed in the second dielectric layer and is contacted with the insulating barrier layer. The MIM capacitor structure can includes a dual damascene structure formed in the second dielectric layer and the insulating barrier layer and electrically connected to the first damascene electrode layer. A method for manufacturing the MIM capacitor structure is also provided.
申请公布号 US2013113075(A1) 申请公布日期 2013.05.09
申请号 US201113292156 申请日期 2011.11.09
申请人 FENG JI;LIAO DUAN-QUAN;GU HAI-LONG;CHEN YING-TU;UNITED MICROELECTRONICS CORPORATION 发明人 FENG JI;LIAO DUAN-QUAN;GU HAI-LONG;CHEN YING-TU
分类号 H01L29/02;H01L21/02 主分类号 H01L29/02
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