发明名称 RESIST COMPOSITION AND METHOD OF MANUFACTURING RESIST PATTERN
摘要 <P>PROBLEM TO BE SOLVED: To provide a resist composition to manufacture a resist pattern with excellent line edge roughness. <P>SOLUTION: A resist composition contains a compound represented by the formula (I), resin and an acid generation agent. The resin contains a structural unit represented by the formula (a1-0) and is insoluble or poorly soluble in an aqueous alkali solution but becomes soluble in the aqueous alkali solution by the action of acid. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013083957(A) 申请公布日期 2013.05.09
申请号 JP20120207889 申请日期 2012.09.21
申请人 SUMITOMO CHEMICAL CO LTD 发明人 SUGIHARA MASAKO;ANDO NOBUO;YAMASHITA HIROKO
分类号 G03F7/039;C08F20/18;G03F7/004;H01L21/027 主分类号 G03F7/039
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