发明名称 SILICON SEMICONDUCTOR DEVICE SUBSTRATE AND MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a silicon substrate and manufacturing method, suitable for a semiconductor device thinned and subjected to back-surface grinding or polishing in a device post-process. <P>SOLUTION: There is provided a silicon substrate and manufacturing method, in which the silicon substrate having devices formed thereon is thinned in a device post-process, and a back surface side of the substrate is heated on a non-melting condition to reduce residual stress on the back surface side to allow reduction in chip strength to be suppressed to improve yield, while preventing diffusion of heavy metal to a device active layer side to allow device characteristics to remain. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013084865(A) 申请公布日期 2013.05.09
申请号 JP20110235447 申请日期 2011.10.06
申请人 ADACHI NAOSHI 发明人 ADACHI NAOSHI
分类号 H01L21/322 主分类号 H01L21/322
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