发明名称 METHOD FOR PREPARING AN N+PP+ OR P+NN+ STRUCTURE ON SILICON WAFERS
摘要 The present invention relates to a method for preparing, on a silicon wafer, an n+pp+ or p+nn+ structure which includes the following consecutive steps: a) on a p or n silicon wafer (1), which includes a front surface (8) and a rear surface (9), a layer of boron-doped silicon oxide (BSG) (2) is formed on the rear surface (9) by PECVD, followed by a SiOx diffusion barrier (3); b) a source of phosphorus is diffused such that the phosphorus and the boron co-diffuse and in order also to form: on the front surface (8) of the wafer obtained at the end of step a), a layer of phosphorus-doped silicon oxide (PSG) (4) and an n+ doped area (5); and on the rear surface of the wafer obtained at the end of step a), a boron-rich area (BRL) (6), as well as a p+ doped area (7); c) the layers of BSG (2) and PSG (4) oxides and SiOx (3) are removed, the BRL (6) is oxidised and the layer resulting from said oxidation is removed. The invention also relates to a silicon wafer having an n+pp+ or p+nn+ structure, which can be obtained by said preparation method, as well as to a photovoltaic panel manufactured from such a silicon wafer.
申请公布号 US2013112260(A1) 申请公布日期 2013.05.09
申请号 US201113643641 申请日期 2011.04.26
申请人 BAZER-BACHI BARBARA;LEMITI MUSTAPHA;LE QUANG NAM;PELLEGRIN YVON;PHOTOWATT INTERNATIONAL;CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE;INSTITUT NATIONAL DES SCIENCES APPLIQUEES DE LYON;SYNERGIES POUR EQUIPEMENTS MICRO-ELECTRONIQUE COMMUNICATION OPTIQUE SA 发明人 BAZER-BACHI BARBARA;LEMITI MUSTAPHA;LE QUANG NAM;PELLEGRIN YVON
分类号 H01L31/18;H01L21/225;H01L29/12;H01L31/0232;H01L31/068 主分类号 H01L31/18
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