发明名称 TRANSMISSION TEST DEVICE, TRANSMISSION TEST METHOD, AND TRANSMISSION TEST PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To continuously incur an error in a transmission path. <P>SOLUTION: A transmission test device 100 that performs a transmission test in a transmission path includes a determining unit 133 and a killer pattern transfer unit 132. The determining unit 133 acquires an abnormality incidence rate representing a rate of abnormality having occurred in test data in the transmission path, and determines whether or not the abnormality incidence rate is lower than a predetermined reference value. When the determining unit 133 determines that the abnormality incidence rate is lower than the predetermined reference value, the killer pattern transfer unit 132 changes the test data and transmits the changed test data. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013085118(A) 申请公布日期 2013.05.09
申请号 JP20110223481 申请日期 2011.10.07
申请人 FUJITSU LTD 发明人 KOBAYASHI TATSUKI
分类号 H04L25/02;H04L29/14 主分类号 H04L25/02
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