SEMICONDUCTOR DEVICE AND TESTING METHOD OF THE SAME

摘要

PURPOSE: A semiconductor device and a testing method thereof are provided to reduce test time and costs by stably performing a multitest operation after a defective cell block is repaired. CONSTITUTION: A pre-selection signal generating unit(100) activates pre-selection signals corresponding to two or more cell blocks by decoding an address in a multitest mode. A selection signal control unit(200) outputs a plurality of pre-selection signals as a plurality of selection signals to prevent the overlap of an activation section of the selection signals corresponding to the activated pre-selection signals. A determination circuit(300) determines whether to repair a cell block which is activated in response to the activated selection signals by using stored repair information and the plurality of selection signals. [Reference numerals] (100) Pre-selection signal generating unit; (200) Selection signal control unit; (300) Determination circuit; (410) 0-th cell block; (420) First cell block; (430) Second cell block; (440) (N-1)-th cell block; (450) Redundancy cell block