发明名称 Method of controlling a vertical dual-gate dynamic random access memory
摘要 A method of controlling a vertical dual-gate DRAM provides a short circuit state, a clearing state and a false broken circuit state. In the short circuit state, a first gate and a second gate at two sides of a first pillar are controlled to respectively have a turn-on voltage to form electric connection between a drain and a source at two ends of the first pillar. In the clearing state, the first gate and second gate are controlled to respectively have a clearing voltage to disconnect electric connection between the drain and source at two ends of the first pillar. The false broken circuit state is entered after the clearing state has been finished. The invention does not separate gates between neighboring pillars, but controls ON/OFF of transistors electrically so that no current leakage is generated in the clearing state and problem of inaccurate data reading can be prevented.
申请公布号 US8437184(B1) 申请公布日期 2013.05.07
申请号 US201113312074 申请日期 2011.12.06
申请人 HSIUNG CHIH-WEI;REXCHIP ELECTRONICS CORPORATION 发明人 HSIUNG CHIH-WEI
分类号 G11C11/34 主分类号 G11C11/34
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