发明名称 Method to manufacture a circuit apparatus having a rounded differential pair trace
摘要 A first artwork layer having a first adaptable-mask section allows a graded amount of light to pass into an underlying first photoresist layer. Subsequent to developing the first photoresist layer, the graded amount of light creates a rounded geometric void used as a mold or sidewall for the creation of at least a lower portion of a rounded trace. A dielectric layer is laminated upon the lower portion and a second artwork layer having an second adaptable-mask section allows a graded amount of light to pass into a second photoresist layer. Subsequent to developing the second photoresist layer, the graded amount of light creates a rounded geometric void used as a mold or sidewall for the creation of at least an upper portion of a rounded trace. The photoresist and dielectric layers are removed resulting in a circuit apparatus having a rounded differential pair trace.
申请公布号 US8434222(B2) 申请公布日期 2013.05.07
申请号 US20100870072 申请日期 2010.08.27
申请人 DOYLE MATTHEW S.;KUCZYNSKI JOSEPH;SPLITTSTOESSER KEVIN A.;TOFIL TIMOTHY J.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DOYLE MATTHEW S.;KUCZYNSKI JOSEPH;SPLITTSTOESSER KEVIN A.;TOFIL TIMOTHY J.
分类号 H05K3/02;H05K3/10 主分类号 H05K3/02
代理机构 代理人
主权项
地址