发明名称 |
THERMAL ACID GENERATOR BOUND MONOMER AND POLYMER OBTAINED FROM THE THERMAL ACID GENERATOR BOUND MONOMER AND THE RESIST UNDERLAYER COMPOSITION INCLUDING THE POLYMER AND METHOD OF FORMING PATTERNS USING THE RESIST UNDERLAYER COMPOSITION |
摘要 |
<p>PURPOSE: A composition for a resist underlayer is provided to improve lithography performance, film density, solvent eruption performance, and exposure performance. CONSTITUTION: A composition for a resist underlayer comprises a polymer obtained from a thermal acid generator-bound monomer, and a solvent. A patterning method comprises a step of providing a material layer on a substrate; a step of applying the composition on the material layer; a step of forming a resist underlayer through heat treatment; a step of forming a resist layer on the resist underlayer; a step of forming a resist pattern by exposure and development; a step of selectively removing the resist underlayer to expose the material layer; and a step of etching the exposed material.</p> |
申请公布号 |
KR20130046355(A) |
申请公布日期 |
2013.05.07 |
申请号 |
KR20120112489 |
申请日期 |
2012.10.10 |
申请人 |
CHEIL INDUSTRIES INC. |
发明人 |
KWON, HYO YOUNG;SHIN, SEUNG WOOK;LEE, SUNG JAE;CHO, YOUN JIN |
分类号 |
C07C309/58;C08G75/20;G03F7/004 |
主分类号 |
C07C309/58 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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