发明名称 Methods of forming CoSi2, methods of forming field effect transistors, and methods of forming conductive contacts
摘要 The invention included to methods of forming CoSi2, methods of forming field effect transistors, and methods of forming conductive contacts. In one implementation, a method of forming CoSi2 includes forming a substantially amorphous layer comprising MSix over a silicon-containing substrate, where "M" comprises at least some metal other than cobalt. A layer comprising cobalt is deposited over the substantially amorphous MSix-comprising layer. The substrate is annealed effective to diffuse cobalt of the cobalt-comprising layer through the substantially amorphous MSix-comprising layer and combine with silicon of the silicon-containing substrate to form CoSi2 beneath the substantially amorphous MSix-comprising layer. Other aspects and implementations are contemplated.
申请公布号 US8435889(B2) 申请公布日期 2013.05.07
申请号 US201113182285 申请日期 2011.07.13
申请人 HU YONGJUN JEFF;MICRON TECHNOLOGY, INC. 发明人 HU YONGJUN JEFF
分类号 H01L21/28;H01L29/43 主分类号 H01L21/28
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