发明名称 Field effect transistor device and fabrication
摘要 A method for forming a field effect transistor (FET) device includes forming a dielectric layer on a substrate, forming a first metal layer on the dielectric layer, removing a portion of the first metal layer to expose a portion of the dielectric layer, forming a second metal layer on the dielectric layer and the first metal layer, and removing a portion of the first metal layer and the second metal layer to define a boundary region between a first FET device and a second FET device.
申请公布号 US8435878(B2) 申请公布日期 2013.05.07
申请号 US20100754917 申请日期 2010.04.06
申请人 GUO DECHAO;HAN SHU-JEN;LIN CHUNG-HSUN;WANG YANFENG;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 GUO DECHAO;HAN SHU-JEN;LIN CHUNG-HSUN;WANG YANFENG
分类号 H01L21/00 主分类号 H01L21/00
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