发明名称 Diodes with embedded dummy gate electrodes
摘要 A circuit structure includes a first isolation region, and a first dummy gate electrode over and vertically overlapping the first isolation region. First pickup regions of a diode are formed on opposite sides of the first isolation region, wherein sidewalls of the first pickup regions contact opposite sidewalls of the first isolation region. Second pickup regions of the diode are formed on opposite sides of a combined region of the first pickup regions and the first isolation region, wherein the first and the second pickup regions are of opposite conductive types. A well region is under the first and the second pickup regions and the first isolation region, wherein the well region is of a same conductivity type as the second pickup regions.
申请公布号 US8436430(B2) 申请公布日期 2013.05.07
申请号 US201113082871 申请日期 2011.04.08
申请人 YU MING-HSIN;YEN KVEI-FENG;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 YU MING-HSIN;YEN KVEI-FENG
分类号 H01L29/772 主分类号 H01L29/772
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