| 摘要 |
A method for illuminating at least one sample in SPIM microscopy includes generating a light beam and forming a light strip from the light beam using an optical device that interacts with the light beam. The light strip is passed strip through at least one objective having optics configured to deliver detection light emanating from the sample directly or indirectly to a detector, with the objective optics interacting with the light strip. The light strip is deflected using a light-redirecting device downstream of the objective optics so as to propagate the light strip, after deflection, at an angle other than zero degrees with respect to an optical axis of the objective in order to illuminate the sample.
|
