发明名称 X-RAY INTERFEROMETER
摘要 Embodiments relate to an X-ray interferometer for imaging an object comprising: a phase grating for effecting in correspondence with the phase grating geometry a phase shift to at least a part of X-ray incident onto the phase grating; and an absorption grating for effecting in correspondence with the absorption grating geometry absorption to at least a part of X-ray incident onto the absorption grating. The grating period of the phase grating, and the grating period of the absorption grating may be dimensioned such that a detector for X-rays can be placed at a relatively large distance away from the absorption grating such the phase contrast sensitivity of the image of the object detected by the detector remains substantially unaffected.
申请公布号 US2013108015(A1) 申请公布日期 2013.05.02
申请号 US201213662936 申请日期 2012.10.29
申请人 CSEM CENTRE SUISSE D'ELECTRONIQUE ET;CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE S.A - RECHERCHE ET DEVELOPPEMENT 发明人 KOTTLER CHRISTIAN;REVOL VINCENT
分类号 G01N23/04 主分类号 G01N23/04
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