发明名称 X-RAY APPARATUS AND X-RAY MEASURING METHOD
摘要 An apparatus for deriving X-ray absorbing and phase information comprises; a splitting element for splitting spatially an X-ray, a detector for detecting intensities of the X-rays transmitted through an object, the intensity of the X-rays changing according to X-ray phase and also position changes, and an calculating unit for calculating an X-ray transmittance image, and an X-ray differential phase contrast or phase sift contrast image as the phase information. The X-ray is split into two or more X-rays having different widths, and emitted onto the detector unit. And, the calculating unit calculates the X-ray absorbing and phase information based on a difference, between the two or more X-rays, in correlation between the changing of the phase of the X-ray and the changing the intensity of the X-ray in the detector unit.
申请公布号 US2013108020(A1) 申请公布日期 2013.05.02
申请号 US201113809335 申请日期 2011.08.01
申请人 MUKAIDE TAIHEI 发明人 MUKAIDE TAIHEI
分类号 G01N23/20 主分类号 G01N23/20
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