METHOD AND AN APPARATUS FOR PARAMETERIZING A SENSOR

摘要

Sensors in a test bench environment need to be parameterized in advance. This is a complex task which has to date been performed largely manually by a test bench engineer. In order to facilitate the parameterization of a sensor (54), it is proposed that the position of the sensor (54) on the object under test (1) be ascertained by means of suitable localization methods and the ascertained position be compared with geometric data for the object under test (1), from which it is possible to derive the position of the sensor (54) on the object under test (1) and, from this position on the object under test, the sensor (54) can be assigned the variable physically measured by the sensor (54).