发明名称 PATTERN-FORMING METHOD
摘要 A pattern-forming method includes applying a photoresist composition to a substrate to form a resist film. The photoresist composition includes an acid generator and a first polymer that includes an acid-dissociable group. The resist film is exposed. The resist film is developed using a developer having an organic solvent content of 80 mass % or more to form a prepattern of the resist film. A polymer film having a phase separation structure in a space defined by the prepattern is formed using a composition that includes a plurality of second polymers. A part of the phase separation structure of the polymer film is removed.
申请公布号 US2013107235(A1) 申请公布日期 2013.05.02
申请号 US201113283582 申请日期 2011.10.28
申请人 NAMAI HAYATO;NAKAGAWA HIROKI;HARADA KENTARO;NARUOKA TAKEHIKO;JSR CORPORATION 发明人 NAMAI HAYATO;NAKAGAWA HIROKI;HARADA KENTARO;NARUOKA TAKEHIKO
分类号 G03B27/52 主分类号 G03B27/52
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