发明名称 Methods of Forming Metal Oxide and Memory Cells
摘要 Some embodiments include methods of forming memory cells. Metal oxide may be deposited over a first electrode, with the deposited metal oxide having a relatively low degree of crystallinity. The degree of crystallinity within the metal oxide may be increased after the deposition of the metal oxide. A dielectric material may be formed over the metal oxide, and a second electrode may be formed over the dielectric material. The degree of crystallinity may be increased with a thermal treatment. The thermal treatment may be conducted before, during, and/or after formation of the dielectric material.
申请公布号 US2013109147(A1) 申请公布日期 2013.05.02
申请号 US201113282355 申请日期 2011.10.26
申请人 ROCKLEIN NOEL;RAMASWAMY D.V. NIRMAL;COLLINS DALE W.;LENGADE SWAPNIL;KRISHNAMURTHY SRIVIDYA;KORBER MARK;MICRON TECHNOLOGY, INC. 发明人 ROCKLEIN NOEL;RAMASWAMY D.V. NIRMAL;COLLINS DALE W.;LENGADE SWAPNIL;KRISHNAMURTHY SRIVIDYA;KORBER MARK
分类号 H01L21/02;C01B13/14;C01D17/00;C01F11/02;C01F17/00;C01G21/02;C01G23/04;C01G45/02;C01G49/02;H01L21/28 主分类号 H01L21/02
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