发明名称 SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a substrate inspection apparatus which performs both macro inspection and micro inspection as a single apparatus, achieving footprint saving and reduction in cycle time. <P>SOLUTION: A substrate inspection apparatus 1 of the present invention includes: a substrate mount unit 2 over which a substrate G to be inspected is mounted, and which has a flotation plate 6 for causing the substrate G to be floated by discharging gas from a discharge port 61; a micro inspection unit 3 which performs micro inspection on the substrate G; a substrate transfer unit 4 which transfers the substrate G floated over the substrate mount unit 2; a macro inspection holder 5 which is provided to go up and down with respect to the substrate mount unit 2, and which holds the substrate G floated over the substrate mount unit 2 while allowing the substrate G to be tilted to stand with respect to an upper surface of the substrate mount unit 2; and a macro illumination unit 15 which illuminates a surface of the substrate G held by the macro inspection holder 5. The macro inspection holder 5 rotates about a rotation axis which is parallel to a transfer direction in which the substrate G is transferred by the substrate transfer unit 4. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013079847(A) 申请公布日期 2013.05.02
申请号 JP20110219297 申请日期 2011.10.03
申请人 OLYMPUS CORP 发明人 KIUCHI TOMOKAZU
分类号 G01N21/84;G01N21/958;G02F1/13 主分类号 G01N21/84
代理机构 代理人
主权项
地址
您可能感兴趣的专利