| 摘要 |
Automatic test equipment (ATE) includes: a circuit to split a stimulus signal, which contains both deterministic and random (noise floor) spectra contents, from a device under test (DUT) into a first signal and a second signal; a first channel to receive the first signal, where the first channel adds a first noise floor to the first signal to produce a first channel signal; a second channel to receive the second signal, where the second channel adds a second noise floor to the second signal to produce a second channel signal, the first noise floor, the second noise floor and the DUT noise floor all being mutually uncorrelated; and processing logic to: estimate a first power of the deterministic stimulus signal, and estimate a second total power based on the first channel signal and the second channel signal. |
