Arrangement for illuminating sample in selective plane illumination microscope, has light source for generating light beam and unit for generating light strip from light beam, particularly for planar-like illumination of sample

摘要

The arrangement has a light source for generating a light beam (1) and a unit for generating a light strip from the light beam. A deflector is provided for deflecting the light strip downstream to an optical system (4.2) of an object lens (4). The light strip is extended after the deflection for illuminating of a sample in an angle deviated from a non-zero, particularly a right angle to an optical axis of the object lens. The light strip is arranged in optical axis of the object lens not parallel to the layer. An independent claim is included for a microscope, particular scanning microscope, a confocal scanning microscope or experimental setup for microscopic imaging of a sample.