发明名称 MEASURING METHOD FOR ELECTRONIC COMPONENT MOUNTING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To accurately measure the position of an electronic component mounted by an electronic component mounting device. <P>SOLUTION: An image of a calibration mark 33, which is provided on an inspection substrate PP and comprises a plurality of recognition marks 34, is captured by a substrate recognition camera 19 and then subjected to recognition processing, thereby obtaining parameters for a magnification and an inclination of the inspection substrate PP. Further, an image of an electronic component mounted on the inspection substrate PP is captured by the substrate recognition camera 19 to recognize a mounting position, thereby correcting the position of the mounted electronic component on the basis of the parameters. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013080746(A) 申请公布日期 2013.05.02
申请号 JP20110218666 申请日期 2011.09.30
申请人 HITACHI HIGH-TECH INSTRUMENTS CO LTD 发明人 YOSHII TAKASHI;IKEDA YOSHINORI;KUMAGAI DAISUKE
分类号 H05K13/08;H05K13/04 主分类号 H05K13/08
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