发明名称 APPARATUSES, INTEGRATED CIRCUITS, AND METHODS FOR MEASURING LEAKAGE CURRENT
摘要 Methods, apparatuses, and integrated circuits for measuring leakage current are disclosed. In one such example method, a word line is charged to a first voltage, and a measurement node is charged to a second voltage, the second voltage being less than the first voltage. The measurement node is proportionally coupled to the word line. A voltage on the measurement node is compared with a reference voltage. A signal is generated, the signal being indicative of the comparison. Whether a leakage current of the word line is acceptable or not can be determined based on the signal.
申请公布号 US2013107640(A1) 申请公布日期 2013.05.02
申请号 US201113282308 申请日期 2011.10.26
申请人 YAMADA SHIGEKAZU;MICRON TECHNOLOGY, INC. 发明人 YAMADA SHIGEKAZU
分类号 G11C7/00;G11C5/14 主分类号 G11C7/00
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