发明名称 TANTALUM SPUTTERING TARGET
摘要 Provided is a tantalum sputtering target containing 1 mass ppm or more and 100 mass ppm or less of niobium as an essential component, and having a purity of 99.999% or more excluding niobium and gas components. Thereby obtained is a high purity tantalum sputtering target comprising a uniform and fine structure and which yields stable plasma and superior film evenness (uniformity).
申请公布号 EP2418299(A4) 申请公布日期 2013.05.01
申请号 EP20100777652 申请日期 2010.04.23
申请人 JX NIPPON MINING & METALS CORPORATION 发明人 FUKUSHIMA ATSUSHI;ODA KUNIHIRO
分类号 C23C14/34;C22C27/02;C22F1/00;C22F1/18;H01L21/28;H01L21/285 主分类号 C23C14/34
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