发明名称 IN-LINE PROCESS MEASUREMENT SYSTEMS AND METHODS
摘要 A method of using multivariate optical computing in real-time to collect instantaneous data about a process stream includes installing an optical analysis system proximate a process line, the process line being configured to move a material past a window of the optical analysis system; illuminating a portion of the material with a light from the optical analysis system; directing the light carrying information about the portion through at least one multivariate optical element in the optical analysis system to produce an instantaneous measurement result about the portion; and continuously averaging the instantaneous measurement result over a period of time to determine an overall measurement signal of the material.
申请公布号 EP2140238(A4) 申请公布日期 2013.05.01
申请号 EP20080799741 申请日期 2008.03.27
申请人 OMETRIC CORPORATION 发明人 PERKINS, DAVID, L.;FREESE, ROBERT, P.;BLACKBURN, JOHN, C.;JAMES, JONATHAN, H.
分类号 G01J3/45 主分类号 G01J3/45
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