发明名称 AUTOMATED ANALYSIS DEVICE AND AUTOMATED ANALYSIS METHOD
摘要 Disclosed is an automatic analyzer which is capable of reducing the influence of scattered light having noise components other than an object to be measured, and is capable of improving the S/N ratio properties of a light reception signal. Data is obtained at a plurality of angles by a plurality of detectors (204 to 206). A signal obtained by one detector selected from among the detectors is selected as a reference signal by a detected data selection unit (18a). An approximation to be applied is selected by an approximation selection unit (18b1) of a first selected data processing unit (18b), and an approximation calculation unit (18b2) calculates an approximation using the selected approximation. A degree of variability of the reference signal is determined by a degree-of-variability calculation unit (18b3). A signal of the detector (205) is held by a second selected data processing unit (18c), and a data correction unit (18d) corrects the signal of the detector (205) by dividing the signal of the detector (205) by the degree of variability of the reference signal. A concentration calculation processing unit (18e) performs the concentration calculation by use of the corrected signal data, and a result output unit (18f) outputs the results on a CRT or the like.
申请公布号 EP2587251(A1) 申请公布日期 2013.05.01
申请号 EP20110798025 申请日期 2011.06.15
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 TAMURA TAKUO;SHIBA MASAKI;ADACHI SAKUICHIRO
分类号 G01N21/51;G01N15/02;G01N35/02 主分类号 G01N21/51
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