发明名称 |
Composition for forming upper layer film for immersion exposure, upper layer film for immersion exposure, and method of forming photoresist pattern |
摘要 |
The object of the invention is to provide a composition for forming an upper layer film for immersion exposure capable of forming an upper layer film effectively inhibited from developing defects through an immersion exposure process, such as a watermark defect and dissolution residue defect. Also provided are an upper layer film for immersion exposure and a method of forming a resist pattern. The composition for forming an upper layer film includes a resin ingredient and a solvent. The resin ingredient includes a resin (A) having at least one kind of repeating units selected among those represented by the formulae (1-1) to (1-3) and at least either of the two kinds of repeating units represented by the formulae (2-1) and (2-2). (1-1) (1-2) (1-3) (2-1) (2-2) [In the formulae, R1 represents hydrogen or methyl; R2 and R3 each represents methylene, linear or branched C2-6 alkylene, or alicyclic C4-12 alkylene; R4 represents hydrogen or methyl; and R5 represents a single bond, methylene, or linear or branched C2-6 alkylene.].
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申请公布号 |
US8431332(B2) |
申请公布日期 |
2013.04.30 |
申请号 |
US20080680200 |
申请日期 |
2008.09.10 |
申请人 |
KOUNO DAITA;SUGIE NORIHIKO;WAKAMATSU GOUJI;NATSUME NORIHIRO;NISHIMURA YUKIO;SUGIURA MAKOTO;JSR CORPORATION |
发明人 |
KOUNO DAITA;SUGIE NORIHIKO;WAKAMATSU GOUJI;NATSUME NORIHIRO;NISHIMURA YUKIO;SUGIURA MAKOTO |
分类号 |
G03F7/11;G03F7/09;G03F7/38 |
主分类号 |
G03F7/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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