发明名称 Height position detecting apparatus and height position detecting method
摘要 A laser beam having an annular spot shape with which a workpiece is irradiated is reflected on an upper surface and a lower surface of the workpiece. The reflected light having the annular spot shape which is reflected on the lower surface of the workpiece is intercepted by a pinhole mask, whereas the reflected light having the annular spot shape which is reflected on the upper surface of the workpiece is permitted to pass through the pinhole mask, and the intensity of light received is detected based on the latter reflected light. Therefore, the height position of the upper surface of a workpiece can be detected even where the workpiece is transmissive to visible rays. In this case, with regard to the reflected light having the annular spot shape which is reflected on the upper surface of the workpiece, the intensity of the light after diffusion by a laser beam diffusing unit is detected by a photodetector having a detecting surface with a predetermined area. This makes it possible to assuredly and accurately detect the upper surface height position of the workpiece, even in the presence of scattering of the annular spot shape.
申请公布号 US8431861(B2) 申请公布日期 2013.04.30
申请号 US20090535336 申请日期 2009.08.04
申请人 SAWABE TAIKI;DISCO CORPORATION 发明人 SAWABE TAIKI
分类号 B23K26/02 主分类号 B23K26/02
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