发明名称 |
Test device for testing transistor characteristics in semiconductor integrated circuit |
摘要 |
A test device of a semiconductor integrated circuit includes: an oscillation unit including a plurality of oscillation circuits and configured to activate the respective oscillation circuits in response to a test mode signal and output a plurality of oscillation signals; a switching unit configured to extract only an activated signal among the plurality of oscillation signals; a frequency division unit configured to divide a signal outputted from the switching unit at a predetermined division ratio and generate a divided oscillation signal; and a data buffer unit configured to buffer the divided oscillation signal to output through a data pad. |
申请公布号 |
US8432179(B2) |
申请公布日期 |
2013.04.30 |
申请号 |
US20100843854 |
申请日期 |
2010.07.26 |
申请人 |
HONG YUN SEOK;SK HYNIX INC. |
发明人 |
HONG YUN SEOK |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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