发明名称 Pitch multiplied mask patterns for isolated features
摘要 Crisscrossing spacers formed by pitch multiplication are used to form isolated features, such as contacts vias. A first plurality of mandrels are formed on a first level and a first plurality of spacers are formed around each of the mandrels. A second plurality of mandrels is formed on a second level above the first level. The second plurality of mandrels is formed so that they cross the first plurality of mandrels, when viewed in a top down view. A second plurality of spacers is formed around each of the second plurality of mandrels. The first and the second mandrels are selectively removed to leave a pattern of voids defined by the crisscrossing first and second pluralities of spacers. These spacers can be used as a mask to transfer the pattern of voids to a substrate. The voids can be filled with conductive material to form conductive contacts.
申请公布号 US8431971(B2) 申请公布日期 2013.04.30
申请号 US201113235722 申请日期 2011.09.19
申请人 TRAN LUAN C.;MICRON TECHNOLOGY, INC. 发明人 TRAN LUAN C.
分类号 H01L21/84 主分类号 H01L21/84
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