发明名称 HIGH ELECTRON MOBILITY TRANSISTOR HAVING REDUCED THRESHOLD VOLTAGE VARIATION AND METHOD OF MANUFACTURING THE SAME
摘要 PURPOSE: A high electron mobility transistor and a manufacturing method thereof are provided to minimize the change of a gate threshold voltage by accurately controlling the thickness of a material layer. CONSTITUTION: A channel layer(34) includes a 2DEG channel and a depletion region. A first channel supply layer(36) is formed on the channel layer. A depletion layer(40) is formed in a part of the first channel supply layer and the depletion region. The depletion region is formed between a source electrode and a drain electrode to face each other. A gate(44) is formed on the depletion layer.
申请公布号 KR20130043047(A) 申请公布日期 2013.04.29
申请号 KR20120059433 申请日期 2012.06.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HWANG, IN JUN;OH, JAE JOON;LEE, JAE WON;CHOI, HYO JI
分类号 H01L29/778;H01L21/335 主分类号 H01L29/778
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