发明名称 PLASMA ETCHING APPARATUS
摘要 PURPOSE: A plasma etching apparatus is provided to improve plasma uniformity by using an upper electrode as segment electrodes. CONSTITUTION: A chamber has a space for generating plasma. An upper electrode(20) faces a lower electrode(30) in the chamber. A first RF generator(40) supplies a first radio frequency power to the upper electrode. A second radio frequency generator(50) supplies a second radio frequency power to the lower electrode. Segment electrodes have a continuous conductivity gradient. [Reference numerals] (AA) Plasma;
申请公布号 KR20130042695(A) 申请公布日期 2013.04.29
申请号 KR20110106718 申请日期 2011.10.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, TAE GON;JEONG, KYEONG SEOK;PARK, MIN JOON
分类号 H01L21/3065;H05H1/46 主分类号 H01L21/3065
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