PURPOSE: A method for manufacturing a semiconductor device is provided to reduce the fault of an insulating layer by performing a second thermal process for annealing. CONSTITUTION: A device isolation region(11) is formed in a semiconductor substrate. Each device isolation region has different width. An insulating layer(110) is formed in the device isolation region. A thermal oxide layer(106) is formed between the insulating layer and the semiconductor substrate. A device formation region(12) is arranged in the semiconductor substrate.
申请公布号
KR20130042304(A)
申请公布日期
2013.04.26
申请号
KR20110106534
申请日期
2011.10.18
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
KIM, HONG GUN;LEE, SEUNG HEON;HONG, EUN KEE;KANG, MAN SUG;BAE, BYEONG JU