发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to reduce the fault of an insulating layer by performing a second thermal process for annealing. CONSTITUTION: A device isolation region(11) is formed in a semiconductor substrate. Each device isolation region has different width. An insulating layer(110) is formed in the device isolation region. A thermal oxide layer(106) is formed between the insulating layer and the semiconductor substrate. A device formation region(12) is arranged in the semiconductor substrate.
申请公布号 KR20130042304(A) 申请公布日期 2013.04.26
申请号 KR20110106534 申请日期 2011.10.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, HONG GUN;LEE, SEUNG HEON;HONG, EUN KEE;KANG, MAN SUG;BAE, BYEONG JU
分类号 H01L21/76;H01L21/316 主分类号 H01L21/76
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