| 摘要 |
Disclosed is a tester (202) for testing an electric discharge stun device (SD). The tester (202) is comprised of a stun device contact element for receiving a discharge from a stun device (SD); a circuit (232) connected to the contact element; a first storage medium, a second storage medium, a processor (230) and a stun device identification element (234). The first storage medium stores information corresponding to at least one of the stun device (SD) and the discharge from the stun device (SD). The second storage medium stores information regarding a known electrical discharge. The information in the first storage medium and the second storage medium comprises at least one of a waveform, an amplitude, a duration, a current, a voltage, an energy, and a temperature. The processor (230) is connected to the circuit (232) for comparing information in the first storage medium to information in the second storage medium. The stun device identification element (234) is connected to the processor (230). |
