DEVICE FOR MEASURING AN ATOMIC FORCE

摘要

The invention relates to a device for measuring an atomic force, comprising a beam (1) whereof a first end carries a microtip (2); a microtip position sensor (6); means (4) of moving the second end of the beam in the axis z of the microtip; a low-frequency servo loop (13) using a signal (11) of the detector and acting on the means of moving to keep the microtip fixed when the force applied to the microtip varies; whereby the variation in force, DeltaF, is given by the expression DeltaF = k Deltaz, where k designates the stiffness of the beam and Deltaz the movement of the means of moving.