发明名称 METHOD OF FORMING AN INTEGRATED CIRCUIT
摘要 A method of forming an integrated circuit is disclosed. A second material layer is formed on a first material layer. A patterned mask layer having a plurality of first features with a first pitch P1 is formed on the second material layer. The second material layer is etched by using the patterned mask layer as a mask to form the first features in the second material layer. The patterned mask layer is trimmed. A plurality of dopants is introduced into the second material layer not covered by the trimmed patterned mask layer. The trimmed patterned mask layer is removed to expose un-doped second material layer. The un-doped second material layer is selectively removed to form a plurality of second features with a second pitch P2. P2 is smaller than P1.
申请公布号 US2013102136(A1) 申请公布日期 2013.04.25
申请号 US201113277552 申请日期 2011.10.20
申请人 HSIEH TZU-YEN;MING-CHING CHANG;LEE CHUN-HUNG;LIN YIH-ANN;CHEN DE-FANG;CHEN CHAO-CHENG;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HSIEH TZU-YEN;MING-CHING CHANG;LEE CHUN-HUNG;LIN YIH-ANN;CHEN DE-FANG;CHEN CHAO-CHENG
分类号 H01L21/04 主分类号 H01L21/04
代理机构 代理人
主权项
地址