发明名称 RESISTANCE CHANGE ELEMENT AND PROGRAMMING METHOD THEREFOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a resistance change element capable of obtaining high reliability and high density, preventing incorrect writing and malfunction. <P>SOLUTION: The resistance change element includes a lamination structure having a first electrode (201), a resistance change film (202), a second electrode (203), an intermediate insulating film (204) and a control electrode (205) laminated in that order. The resistance change layer (202) has no direct contact with the intermediate insulating film (204). <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013077681(A) 申请公布日期 2013.04.25
申请号 JP20110216256 申请日期 2011.09.30
申请人 NEC CORP 发明人 TADA MUNEHIRO;MIYAMURA MAKOTO
分类号 H01L27/105;G11C13/00;H01L21/82;H01L27/10;H01L45/00;H01L49/00 主分类号 H01L27/105
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