发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device used as a switching element and having a high withstanding voltage and low on-resistance at low cost. <P>SOLUTION: The semiconductor device comprises: a semiconductor substrate containing a first conductivity type impurity and having a first principal surface and a second principal surface opposed to each other; a first diffusion region containing a second conductivity type impurity at a first concentration and formed so as to be exposed on the first principal surface of the semiconductor substrate; a second diffusion region containing the second conductivity type impurity at a second concentration higher than the first concentration and formed lateral to the first diffusion region so as to be exposed on the first principal surface of the semiconductor substrate; a third diffusion region containing the first conductivity type impurity and formed above the first diffusion region so as to be exposed on the first principal of the semiconductor substrate; and a control electrode opposing the second diffusion region via an insulation film. The first diffusion region and the second diffusion region form a main path of a current controlled depending on a voltage applied to the control electrode. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013077662(A) |
申请公布日期 |
2013.04.25 |
申请号 |
JP20110215808 |
申请日期 |
2011.09.30 |
申请人 |
SANKEN ELECTRIC CO LTD |
发明人 |
KOYAMA MICHIKO;AIZAWA KAZUYA |
分类号 |
H01L21/336;H01L29/06;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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